Study of the modulation characterization of phase-only liquid crystal spatial light modulator by digital holography

Spozmai Panezai; Dayong Wang; Jie Zhao; Yunxin Wang

doi:10.1117/12.975751

15 October 2012 Study of the modulation characterization of phase-only liquid crystal spatial light modulator by digital holography

Spozmai Panezai, Dayong Wang, Jie Zhao, Yunxin Wang

Author Affiliations +

Proceedings Volume 8420, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing; 84200F (2012) https://doi.org/10.1117/12.975751
Event: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012), 2012, Xiamen, China

Abstract

The liquid crystal spatial light modulator is becoming a more and more important device due to its wide applications. During its characterization, the phase modulation is the most important one. In this paper, the modulation characterization of a PLUTO phase-only spatial light modulator based on liquid crystal on silicon (LCOS) is studied by applying the lensless Fourier transform digital holography. In the digital holography, the LCOS is used as a reflected sample which modulates the phase of the incident wavefront with respect to the addressed gray level and gives the information of entire active region. This result is then compared with the result obtained by using conventional Michelson Interferometric method and both results are in good accordance with each other. At last the same holographic set up is used for the imaging of phase grating as a reflected object which is addressed to the LCOS and the clear profilometry of the grating is achieved.

Citation Download Citation

Spozmai Panezai, Dayong Wang, Jie Zhao, and Yunxin Wang "Study of the modulation characterization of phase-only liquid crystal spatial light modulator by digital holography", Proc. SPIE 8420, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing, 84200F (15 October 2012); https://doi.org/10.1117/12.975751

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available