Paper
15 October 2012 Growth and properties of nonpolar a-plane GaN grown on r-sapphire by plasma assisted molecular beam epitaxy
Mohana K. Rajpalke, Thirumaleshwara N. Bhat, Mahesh Kumar, Basanta Roul, S. B. Krupanidhi
Author Affiliations +
Proceedings Volume 8549, 16th International Workshop on Physics of Semiconductor Devices; 85492W (2012) https://doi.org/10.1117/12.927418
Event: 16th International Workshop on Physics of Semiconductor Devices, 2011, Kanpur, India
Abstract
The growth of nonpolar a- plane (1 1 -2 0) orientation of the GaN epilayers were confirmed by high resolution x-ray diffraction studies. An in-plane orientation relationship was found to be [0 0 0 1] GaN || [-1 1 0 1] sapphire and [-1 1 0 0] GaN || [1 1 -2 0] sapphire. SEM image shows the reasonably smooth surface. The photoluminescence spectrum shows near band emission (NBE) at 3.439 eV. The room temperature I-V characteristics of Au/a-GaN schottky diode performed. The Schottky barrier height b) and the ideality factor (η) for the Au/a-GaN schottky diode found to be 0.50 eV and 2.01 respectively.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mohana K. Rajpalke, Thirumaleshwara N. Bhat, Mahesh Kumar, Basanta Roul, and S. B. Krupanidhi "Growth and properties of nonpolar a-plane GaN grown on r-sapphire by plasma assisted molecular beam epitaxy", Proc. SPIE 8549, 16th International Workshop on Physics of Semiconductor Devices, 85492W (15 October 2012); https://doi.org/10.1117/12.927418
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KEYWORDS
Gallium nitride

Diodes

Sapphire

Molecular beam epitaxy

Scanning electron microscopy

Luminescence

Plasma

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