Focused ion beam (FIB) is a highly versatile technique which helps to enable next generation of lab-on-fiber sensor
technologies. In this paper, we demonstrate the application of FIB to precisely mill the fiber taper and end facet of both
conventional single mode fiber (SMF) and photonic crystal fiber (PCF). Using this technique we fabricate a highly
compact fiber-optic Fabry-Pérot (FP) refractive index sensor near the tip of a fiber taper, and a highly sensitive in-line
temperature sensor in a PCF. We also demonstrate the potential of using FIB to selectively fill functional fluid into
desired patterns of air holes in a PCF.
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Wu Yuan ; Fei Wang and Ole Bang
Optical fiber sensors fabricated by the focused ion beam technique
", Proc. SPIE 8421, OFS2012 22nd International Conference on Optical Fiber Sensors, 842173 (October 4, 2012); doi:10.1117/12.974932; http://dx.doi.org/10.1117/12.974932