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Proceedings Article

Optical fiber sensors fabricated by the focused ion beam technique

[+] Author Affiliations
Wu Yuan

Singapore Institute of Manufacturing Technology (Singapore)

Fei Wang

Technical Univ. of Denmark (Denmark)

Ole Bang

Techincal Univ. of Denmark (Denmark)

Proc. SPIE 8421, OFS2012 22nd International Conference on Optical Fiber Sensors, 842173 (October 4, 2012); doi:10.1117/12.974932
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From Conference Volume 8421

  • OFS2012 22nd International Conference on Optical Fiber Sensors
  • Yanbiao Liao; Wei Jin; David D. Sampson; Ryozo Yamauchi; Youngjoo Chung; Kentaro Nakamura; Yunjiang Rao
  • Beijing, China | October 14, 2012

abstract

Focused ion beam (FIB) is a highly versatile technique which helps to enable next generation of lab-on-fiber sensor technologies. In this paper, we demonstrate the application of FIB to precisely mill the fiber taper and end facet of both conventional single mode fiber (SMF) and photonic crystal fiber (PCF). Using this technique we fabricate a highly compact fiber-optic Fabry-Pérot (FP) refractive index sensor near the tip of a fiber taper, and a highly sensitive in-line temperature sensor in a PCF. We also demonstrate the potential of using FIB to selectively fill functional fluid into desired patterns of air holes in a PCF. © (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation

Wu Yuan ; Fei Wang and Ole Bang
" Optical fiber sensors fabricated by the focused ion beam technique ", Proc. SPIE 8421, OFS2012 22nd International Conference on Optical Fiber Sensors, 842173 (October 4, 2012); doi:10.1117/12.974932; http://dx.doi.org/10.1117/12.974932


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