Paper
15 October 2012 Measurement of power spectral density of optical super-smooth surface
Dai Lei
Author Affiliations +
Proceedings Volume 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 84171B (2012) https://doi.org/10.1117/12.970308
Event: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012), 2012, Xiamen, China
Abstract
This Paper discusses techniques for measurements power spectral density (PSD) of optical super-smooth surface using scanning white light interferometer (SWLI). Analyzing the key point of PSD measurement, how to reduce the noise level and the system error. Using different objectives to test surface and giving PSD distribution spatial frequency range from 1 to 1000 mm-1. Then it will be convenient to the roughness of certain spatial frequency range. Roughness of super smooth surface is nearly 0.5nm rms from 1 to 1000 mm-1.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dai Lei "Measurement of power spectral density of optical super-smooth surface", Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84171B (15 October 2012); https://doi.org/10.1117/12.970308
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Spatial frequencies

Charge-coupled devices

Interferometers

Optical testing

Calibration

CCD image sensors

Error analysis

RELATED CONTENT

An analysis of light spot extracting based on LED
Proceedings of SPIE (October 25 2016)
On orbit performance of the WINDII instrument on the Upper...
Proceedings of SPIE (September 30 1994)
Novel method for disk run-out testing
Proceedings of SPIE (December 08 1998)
Defining the measurand in radius of curvature measurements
Proceedings of SPIE (November 20 2003)
Scanning form measurement for curved surfaces
Proceedings of SPIE (September 15 2005)

Back to Top