Wall thickness detection based on x-ray image processing technology

Lei Zhang; Guoyu Zhang; Jiang Yu; Wu Kui

doi:10.1117/12.978835

15 October 2012 Wall thickness detection based on x-ray image processing technology

Lei Zhang, Guoyu Zhang, Jiang Yu, Wu Kui

Proceedings Volume 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 841722 (2012) https://doi.org/10.1117/12.978835
Event: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012), 2012, Xiamen, China

Abstract

This paper analyzes the cause and characteristics of noises in low intensity X-ray real-time imaging system with X-ray image intensifier. According to the human visual characteristics and image characteristics of the measured object, signal to noise reduction and superposition enhancement of the gray-scale image are used to reduce the image noise so that high-quality real-time image processing can be realized. With the smoothing filter to process the image edge and the using of edge extraction algorithm, the limit of contrast sensitivity threshold for human eye is broken through and high-precision edge recognition is achieved in low contrast images. The paper also analyzes projection error of the projection imaging and presents the scheme of segmented variable magnification factor compensation, so that measurement accuracy can reach 0.1mm.

Citation Download Citation

Lei Zhang, Guoyu Zhang, Jiang Yu, and Wu Kui "Wall thickness detection based on x-ray image processing technology", Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 841722 (15 October 2012); https://doi.org/10.1117/12.978835

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