Measurement method for the transition width of precision approach path indicator based on spectral means

Haiping Shen; Xiaoli Zhou; Wanlu Zhang; Jiangen Pan; Muqing Liu

doi:10.1117/12.980254

15 October 2012 Measurement method for the transition width of precision approach path indicator based on spectral means

Haiping Shen, Xiaoli Zhou, Wanlu Zhang, Jiangen Pan, Muqing Liu

Author Affiliations +

Proceedings Volume 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 841743 (2012) https://doi.org/10.1117/12.980254
Event: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012), 2012, Xiamen, China

Abstract

This paper introduces a new colorimetric measurement method for the transition width of the precision approach path indicator. The measurement system consists of a spectrometer, a fiber probe, a moving means and a ruler. The spectrometer is used to measure the chromaticity coordinates to distinguish the white and red light. The fiber probe is the input of the spectrometer. It is fixed to the moving means, which can move along with the upright rule. The precision approach path indicator certain distance away projects the light to the fiber probe. By moving the fiber probe crossing the transition sector up and down, the chromaticity coordinate of the light moves from the white area to the red area. The intermediate distance of the fiber probe is the width of the transition sector. Use the ruler to measure it and then calculate it to angle. With the measurement distance of 10 meter and the precision of the ruler 1 millimeter, the precision of the system can be 21 seconds of arc. Compared with the traditional measurement methods, the method introduced in this paper is more precise and it strictly accords with the ICAO standard Annex 14.

Citation Download Citation

Haiping Shen, Xiaoli Zhou, Wanlu Zhang, Jiangen Pan, and Muqing Liu "Measurement method for the transition width of precision approach path indicator based on spectral means", Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 841743 (15 October 2012); https://doi.org/10.1117/12.980254

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