Recent tests of x-ray spectrometers using polycapillary optics

Steve Heald; Gerald T. Seidler; Devon Mortensen; Brian Mattern; Joseph A. Bradley; Nancy Hess; Mark Bowden

doi:10.1117/12.929960

15 October 2012 Recent tests of x-ray spectrometers using polycapillary optics

Steve Heald, Gerald T. Seidler, Devon Mortensen, Brian Mattern, Joseph A. Bradley, Nancy Hess, Mark Bowden

Proceedings Volume 8502, Advances in X-Ray/EUV Optics and Components VII; 85020I (2012) https://doi.org/10.1117/12.929960
Event: SPIE Optical Engineering + Applications, 2012, San Diego, California, United States

Abstract

Polycapillary optics provide a promising approach for coupling highly-divergent x-ray emission or inelastic scattering to high-resolution crystal analyzers. We present recent results looking at the application of polycapillary collimators to emission spectrometers. The first application uses a collimating optic and a flat crystal to provide a tunable x-ray fluorescence detector. At high-flux synchrotron radiation sources there is sufficient flux (~10¹³ ph/sec) to allow application of X-ray Absorption Spectroscopy (XAS) to ppb concentrations if the fluorescence signal can be isolated from an intense background. The polycapillary based analyzer easily achieves the <10⁶ background reduction needed for such measurements. It has the additional advantage of being confocal, only collecting the signal from a small volume at the optic focus, effectively eliminating background from sample substrates, windows, or air scattering. Second, the same type of analyzer can be used for higher-resolution emission spectroscopy if operated close to 90° Bragg angle, and we report results of the commissioning of a user-available instrument suitable for few-eV resolution emission spectroscopy, including the demonstration of roughly order-of-magnitude improved measurement times compared to use of a traditional, single spherically-bent crystal analyzer. As part of this effort, we have developed a process for enhancing the integral reflectivity of Si analyzer crystals through plastic deformation at high temperatures.

Citation Download Citation

Steve Heald, Gerald T. Seidler, Devon Mortensen, Brian Mattern, Joseph A. Bradley, Nancy Hess, and Mark Bowden "Recent tests of x-ray spectrometers using polycapillary optics", Proc. SPIE 8502, Advances in X-Ray/EUV Optics and Components VII, 85020I (15 October 2012); https://doi.org/10.1117/12.929960

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