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Proceedings Article

On-axis and off-axis characterization of MWIR and LWIR imaging systems using quadri-wave interferometry

[+] Author Affiliations
Sabrina Velghe, Djamel Brahmi, William Boucher, Benoit Wattellier

PHASICS S.A. (France)

Proc. SPIE 8355, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII, 83550B (May 18, 2012); doi:10.1117/12.919204
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From Conference Volume 8355

  • Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII
  • Gerald C. Holst; Keith A. Krapels
  • Baltimore, Maryland, USA | April 23, 2012

abstract

The Quadri-Wave Lateral Shearing Interferometry (QWLSI) is an innovative wave front sensing technique that is commercially available for MWIR and LWIR applications. We present this technology and its application to the metrology, on and off-axis, of infrared imaging systems. The bench is only composed of a collimated reference beam that creates a source point at infinity, the objective to analyze and the sensor placed a few millimeters after the focal spot. Thanks to this direct measurement configuration, the alignment process is very simple and fast. A complete characterization (aberrations, MTF, field curvature) for several field points is possible within a few minutes.© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation

Sabrina Velghe ; Djamel Brahmi ; William Boucher and Benoit Wattellier
"On-axis and off-axis characterization of MWIR and LWIR imaging systems using quadri-wave interferometry", Proc. SPIE 8355, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII, 83550B (May 18, 2012); doi:10.1117/12.919204; http://dx.doi.org/10.1117/12.919204


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