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Proceedings Article

Research on sensor technology of Lamb-wave signal acquisition using optical low-coherence

[+] Author Affiliations
Y. K. Zhu, C. Yang, X. W. Li, B. Chong

Nanjing Univ. of Aeronautics and Astronautics (China)

Proc. SPIE 8541, Electro-Optical and Infrared Systems: Technology and Applications IX, 85411I (October 24, 2012); doi:10.1117/12.974785
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From Conference Volume 8541

  • Electro-Optical and Infrared Systems: Technology and Applications IX
  • David A. Huckridge; Reinhard R. Ebert
  • Edinburgh, , United Kingdom | September 24, 2012

abstract

Non-destructive testing of composite materials is a key technology issue in equipment testing. Among the emerging new testing methods, Lamb-wave technology is getting more and more attention. This paper proposed a sensing method to acquire the Lamb-wave signal in thin plate based on optical low-coherence principles. Methods to acquire Lamb-wave in thin plate using optical low-coherence technology were analyzed, and the technical path of non-contact, high-precision method was chosen. Complete in-line experimental system and methods were designed and built up for testing. A sensor system based on Michelson low-coherence interferometer was set up. The distributed optical fiber sensors were arranged on the top of sample materials for signal detection. Mirrors to enhance reflection intensity were attached on the sample. The phase of sensing arm was modulated by PZT vibration. Then signals were detected and processed by Daubechies10 wavelet and Gabor wavelet. In-line testing of thin plate with features of high-precision and high signal-noise-ratio was realized, which is meaningful to dynamic testing of large-scale structure.© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation

Y. K. Zhu ; C. Yang ; X. W. Li and B. Chong
"Research on sensor technology of Lamb-wave signal acquisition using optical low-coherence", Proc. SPIE 8541, Electro-Optical and Infrared Systems: Technology and Applications IX, 85411I (October 24, 2012); doi:10.1117/12.974785; http://dx.doi.org/10.1117/12.974785


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