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Proceedings Article

Comparison of laboratory-scale XUV laser with xFELs

[+] Author Affiliations
Davide Bleiner

Univ. of Bern (Switzerland)

Proc. SPIE 8678, Short-Wavelength Imaging and Spectroscopy Sources, 867806 (December 11, 2012); doi:10.1117/12.2008733
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From Conference Volume 8678

  • Short-Wavelength Imaging and Spectroscopy Sources
  • Davide Bleiner
  • Bern, Switzerland | September 10, 2012

abstract

Amplification of short-wavelength radiation is advantageously done across a plasma medium. The latter can be produced either using a powerful pump laser or by means of a capillary discharge. The main advantages of this scheme are the ultra-narrow linewidth (Q ≈ 10,000), the full temporal coherence, and the compact footprint. These figures-of-merit are complementary to those of short-wavelength free-electron lasers (xFEL). xFEL facilities are currently available in a few sites, due to the remarkable cost of construction and operation. After a general introduction on laboratory-scale short-wavelength lasers, a comparison with state-of-art xFEL will be done. © (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation

Davide Bleiner
" Comparison of laboratory-scale XUV laser with xFELs ", Proc. SPIE 8678, Short-Wavelength Imaging and Spectroscopy Sources, 867806 (December 11, 2012); doi:10.1117/12.2008733; http://dx.doi.org/10.1117/12.2008733


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