Elemental analysis with x-ray fluorescence spectrometry

Peter Lienemann; Davide Bleiner

doi:10.1117/12.2010944

11 December 2012 Elemental analysis with x-ray fluorescence spectrometry

Peter Lienemann, Davide Bleiner

Proceedings Volume 8678, Short-Wavelength Imaging and Spectroscopy Sources; 86780D (2012) https://doi.org/10.1117/12.2010944
Event: Short-Wavelength Imaging and Spectroscopy, 2012, Bern, Switzerland

Abstract

Elemental analysis by means of X-ray fluorescence (XRF) spectrometry is based on the element-specific electro- magnetic radiation induced as a consequence of inner-shell ionization. XRF spectrometry is ideal for the direct analysis of solid samples, but can also investigate fluid samples. On one side, these methods allow the rapid qualitative screening of unknown samples, without any particular sample preparation. On the other hand, it is possible to perform the fully automated quantitative analysis of large sample sets. Further figures of merit are the ’standard-less’ analysis of samples in a non-destructive mode, and detection down to 0.01 %. The availability of portable XRF systems6 is a further advantage for on-site measurements. The fundamentals are discussed to orient the user, and a survey of instrumental capabilities is provided.

Citation Download Citation

Peter Lienemann and Davide Bleiner "Elemental analysis with x-ray fluorescence spectrometry", Proc. SPIE 8678, Short-Wavelength Imaging and Spectroscopy Sources, 86780D (11 December 2012); https://doi.org/10.1117/12.2010944

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