Full Content is available to subscribers

Subscribe/Learn More  >
Proceedings Article

Analysis of bulk and facet failures in AlGaAs-based high-power diode lasers

[+] Author Affiliations
Jens W. Tomm, Martin Hempel, Thomas Elsaesser

Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie (Germany)

Fabio La Mattina

EMPA (Switzerland)

Frank M. Kießling

Leibniz-Institut für Kristallzüchtung (Germany)

Proc. SPIE 8640, Novel In-Plane Semiconductor Lasers XII, 86401F (March 4, 2013); doi:10.1117/12.2003465
Text Size: A A A
From Conference Volume 8640

  • Novel In-Plane Semiconductor Lasers XII
  • Alexey A. Belyanin; Peter M. Smowton
  • San Francisco, California, USA | February 02, 2013

abstract

Mechanisms are addressed limiting the reliability high-power diode lasers. An overview is given on the kinetics of the Catastrophic Optical Damage (COD) process, which is related to highest output powers. It involves fast defect growth fed by re-absorption of laser light. Local temperatures reach the order of the melting temperature of the waveguide of the device. The process starts either at a facet or at any weak point, e.g., at extended defects in the interior of the cavity. © (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation

Jens W. Tomm ; Martin Hempel ; Fabio La Mattina ; Frank M. Kießling and Thomas Elsaesser
" Analysis of bulk and facet failures in AlGaAs-based high-power diode lasers ", Proc. SPIE 8640, Novel In-Plane Semiconductor Lasers XII, 86401F (March 4, 2013); doi:10.1117/12.2003465; http://dx.doi.org/10.1117/12.2003465


Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).

Figures

Tables

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement
  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.