Mechanisms are addressed limiting the reliability high-power diode lasers. An overview is given on the kinetics of the Catastrophic Optical Damage (COD) process, which is related to highest output powers. It involves fast defect growth fed by re-absorption of laser light. Local temperatures reach the order of the melting temperature of the waveguide of the device. The process starts either at a facet or at any weak point, e.g., at extended defects in the interior of the cavity.
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Jens W. Tomm ; Martin Hempel ; Fabio La Mattina ; Frank M. Kießling and Thomas Elsaesser
Analysis of bulk and facet failures in AlGaAs-based high-power diode lasers
", Proc. SPIE 8640, Novel In-Plane Semiconductor Lasers XII, 86401F (March 4, 2013); doi:10.1117/12.2003465; http://dx.doi.org/10.1117/12.2003465