Open Access Paper
16 April 2013 Front Matter: Volume 8685
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 8685, including the Title Page, Copyright Information, Table of Contents, Introduction and Conference Committee listing.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 8685", Proc. SPIE 8685, Advanced Etch Technology for Nanopatterning II, 868501 (16 April 2013); https://doi.org/10.1117/12.2028903
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KEYWORDS
Etching

Optical lithography

Plasma etching

Line edge roughness

Plasma

Nanotechnology

Lithography

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