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29 May 2013 Implementing STEM technology in a Title One middle school classroom
Carolyn Holcomb
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Proceedings Volume 8729, Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences; 87290E (2013) https://doi.org/10.1117/12.2016152
Event: SPIE Defense, Security, and Sensing, 2013, Baltimore, Maryland, United States
Abstract
What do a modern day CSI forensics lab and an electron microscope have in common? It offers the ability to engage students in a scientific investigation, exploring the world of nanotechnology using modern day equipment. 7th grade students at Western Heights Middle School at Hagerstown, MD, used Hitachi’s TM3000 to better understand how technology is utilized when investigating contemporary questions. Using the TM3000, students learned how to load samples, scan, take pictures, and focus the SEM. This experience was an eye opener to students who otherwise would never have had such a learning opportunity. As a result many verbalized interest in pursuing careers in STEM related fields, if only to be able to use such fun equipment. In this session the teacher will present how the instrument was used, and the lessons learned both by the instructor and her students.
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Carolyn Holcomb "Implementing STEM technology in a Title One middle school classroom", Proc. SPIE 8729, Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 87290E (29 May 2013); https://doi.org/10.1117/12.2016152
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KEYWORDS
Scanning transmission electron microscopy
Scanning electron microscopy
Forensic science
Microscopes
Electron microscopes
Microscopy
Eye
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