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Proceedings Article

Characterization of the optical components fabricated by femtosecond pulses in transparent materials

[+] Author Affiliations
Lina Mazule, Simona Liukaityte, Vytautas Sabonis, Mindaugas Mikutis, Domas Paipulas, Tomas Puodziunas, Valdas Sirutkaitis

Vilnius Univ. (Lithuania)

Titas Gertus

ALTECHNA Co. Ltd. (Lithuania)

Proc. SPIE 8839, Dimensional Optical Metrology and Inspection for Practical Applications II, 883909 (September 6, 2013); doi:10.1117/12.2022823
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From Conference Volume 8839

  • Dimensional Optical Metrology and Inspection for Practical Applications II
  • Kevin G. Harding; Peisen S. Huang; Toru Yoshizawa
  • San Diego, California, United States | August 25, 2013

abstract

We report optical characterization of the different optical components fabricated in transparent materials by bulk refractive index modification or surface ablation by femtosecond pulses. The methods used for characterization of the components with refractive index modification fabricated in fused silica by high repetition rate femtosecond KGW:Yb laser were transmission and diffraction measurements at 532 and 632.8 nm wavelengths, and total integrated scattering (TIS) at 532 mn wavelength. The combined characterization methods were sufficient for modification process optimization and allowed creation of the Bragg gratings with diffraction efficiency in range from 55 to 90% and low scattering losses. The forward and backward TIS measurements of the radial polarization converter showed that forward scattering is more than five times as high as backward scattering. Solar cells with modified surface by femtosecond pulse ablation were investigated by TIS and Volt-Ampere measurements. The current increase is registered with growth of the scattering loses in the solar cells. © (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation

Lina Mazule ; Simona Liukaityte ; Vytautas Sabonis ; Titas Gertus ; Mindaugas Mikutis, et al.
" Characterization of the optical components fabricated by femtosecond pulses in transparent materials ", Proc. SPIE 8839, Dimensional Optical Metrology and Inspection for Practical Applications II, 883909 (September 6, 2013); doi:10.1117/12.2022823; http://dx.doi.org/10.1117/12.2022823


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