Size effect of aluminum / silicon-dioxide / aluminum nanosandwich films for negative optical properties

Yi-Jun Jen; Hung-Sheng Liao; Meng-Jie Lin

doi:10.1117/12.2023993

19 September 2013 Size effect of aluminum / silicon-dioxide / aluminum nanosandwich films for negative optical properties

Yi-Jun Jen, Hung-Sheng Liao, Meng-Jie Lin

Author Affiliations +

Proceedings Volume 8818, Nanostructured Thin Films VI; 881817 (2013) https://doi.org/10.1117/12.2023993
Event: SPIE NanoScience + Engineering, 2013, San Diego, California, United States

Abstract

In this work, three different aluminum (Al) / silicon-dioxide (SiO₂) / aluminum (Al) nanosandwich films (SWFs) with different sizes are deposited using glancing angle deposition (GLAD) with continuous azimuthal rotation. The SWF comprises an SiO₂ layer that is sandwiched between Al nanopillars. The thickness of SiO₂ is fixed at 45nm. The thicknesses d of the top and bottom Al nanopillar is varied from 188nm to 233nm. The equivalent electromagnetic parameters of each film are derived from the reflection coefficients and transmission coefficients that are measured by walk-off and polarization interferometers. The equivalent optical parameters revealed that it has a negative real equivalent permittivity and a negative real equivalent permeability. The effect of size of the Al / SiO₂ / Al SWFs on their optical properties is also examined. As the thickness d increases from 188nm to 233nm, the equivalent refractive index is negative and its average magnitude decreases from -1.703 to -1.247. Similarly, the real part of the equivalent permittivity varies from -1.193 to -0.824 as the thickness increased. The SWFs are simulated to analyze the magnetic field in the SiO2 layer by finite-difference time-domain (FDTD) method. The result of the simulation shows that the negative permeability arises from the reversal of the magnetic resonance within the SiO2 layer. The reversed magnetic field becomes weaker as the thickness d increases.

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Yi-Jun Jen, Hung-Sheng Liao, and Meng-Jie Lin "Size effect of aluminum / silicon-dioxide / aluminum nanosandwich films for negative optical properties", Proc. SPIE 8818, Nanostructured Thin Films VI, 881817 (19 September 2013); https://doi.org/10.1117/12.2023993

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KEYWORDS

Aluminum

Magnetism

Refractive index

Silica

Reflection

Transmittance

Finite-difference time-domain method

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