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Proceedings Article

Numerical modeling of scattering type scanning near-field optical microscopy

[+] Author Affiliations
Arvindvivek Ravichandran, Edward C. Kinzel

Missouri Univ. of Science and Technology (United States)

James C. Ginn

Plasmonics Inc. (United States)

Jeffery A. D'Archangel, Glenn D. Boreman

CREOL, The College of Optics and Photonics, Univ. of Central Florida (United States)

Eric Z. Tucker

The Univ. of North Carolina at Charlotte (United States)

Brian A. Lail

Florida Institute of Technology (United States)

Markus B. Raschke

Univ. of Colorado at Boulder (United States)

Proc. SPIE 8815, Nanoimaging and Nanospectroscopy, 88150S (September 20, 2013); doi:10.1117/12.2023513
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From Conference Volume 8815

  • Nanoimaging and Nanospectroscopy
  • Prabhat Verma; Alexander Egner
  • San Diego, California, United States | August 25, 2013

abstract

Apertureless scattering-type Scanning Near-field Optical Microscopy (s-SNOM) has been used to study the electromagnetic response of infrared antennas below the diffraction limit. The ability to simultaneously resolve the phase and amplitude of the evanescent field relies on the implementation of several experimentally established background suppression techniques. We model the interaction of the probe with a patch antenna using the Finite Element Method (FEM). Green's theorem is used to predict the far-field, cross-polarized scattering and to construct the homodyne amplified signal. This approach allows study of important experimental phenomena, specifically the effects of the reference strength, demodulation harmonic, and detector location. © (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation

Arvindvivek Ravichandran ; Edward C. Kinzel ; James C. Ginn ; Jeffery A. D'Archangel ; Eric Z. Tucker, et al.
" Numerical modeling of scattering type scanning near-field optical microscopy ", Proc. SPIE 8815, Nanoimaging and Nanospectroscopy, 88150S (September 20, 2013); doi:10.1117/12.2023513; http://dx.doi.org/10.1117/12.2023513


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