NIR-Vis-UV permittivity of nanoporous C-Pd thin films determined using spectroscopic ellipsometry

Aleksandra A. Wronkowska; Grażyna Czerniak; Andrzej Wronkowski; Elżbieta Czerwosz; Ewa Kowalska

doi:10.1117/12.2032241

25 October 2013 NIR-Vis-UV permittivity of nanoporous C-Pd thin films determined using spectroscopic ellipsometry

Aleksandra A. Wronkowska, Grażyna Czerniak, Andrzej Wronkowski, Elżbieta Czerwosz, Ewa Kowalska

Proceedings Volume 8903, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2013; 89030F (2013) https://doi.org/10.1117/12.2032241
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2013, 2013, Wilga, Poland

Abstract

In this work, spectroscopic ellipsometry combined with transmittance measurements in a spectral range of 0.6 - 6.5eV (2.2μm – 193nm) have been used to determine the thickness and optical constants of carbon-palladium thin films. The C-Pd nanocomposite samples are synthesised by physical vapour deposition and chemical vapour deposition methods on to fused silica substrates. The C₆₀ fullerene and palladium acetate are used as the source materials. The effective complex dielectric functions [equation-see manuscript] of the particulate films are found to depend strongly on preparation technology and concentration of Pd nanoparticles embedded in the carbon matrix. Optical parameterisation with a Drude-Lorentz model of the dielectric functions has been applied to match the experimental data. Influence of chemical treatment and Pd nanoparticles on structural disorder and relevant optical and electronic properties of the C-Pd samples is analysed.

Citation Download Citation

Aleksandra A. Wronkowska, Grażyna Czerniak, Andrzej Wronkowski, Elżbieta Czerwosz, and Ewa Kowalska "NIR-Vis-UV permittivity of nanoporous C-Pd thin films determined using spectroscopic ellipsometry", Proc. SPIE 8903, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2013, 89030F (25 October 2013); https://doi.org/10.1117/12.2032241

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available