Paper
16 December 2013 Vanadium dioxide thin films for smart windows: optical design and performance improvement
Xinfeng He, Congcong Gu, Fei Chen, Xiaofeng Xu
Author Affiliations +
Proceedings Volume 9068, Eighth International Conference on Thin Film Physics and Applications; 90680G (2013) https://doi.org/10.1117/12.2054369
Event: Eighth International Conference on Thin Film Physics and Applications (TFPA13), 2013, Shanghai, China
Abstract
The high quality vanadium dioxide (VO2) thin films have been fabricated successfully on sapphire by a simple novel sputtering oxidation coupling (SOC) method. Transmittance spectra of vanadium dioxide film have been measured between 25 °C and 90 °C. The thin film samples exhibit a good insulator-metal transition near room temperature. The optical constants of VO2 thin film samples were derived by fitting the transmittance spectra using the Drude-Lorentz model. In order to improve the transition efficiency, the thin film thickness was optimized by the optical design. The calculated results with different thin film thickness show that VO2 thin film with 84 nm owns a maximums value of the transition efficiency. This research will promote VO2 thin film optical performance improvement for the smart windows.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xinfeng He, Congcong Gu, Fei Chen, and Xiaofeng Xu "Vanadium dioxide thin films for smart windows: optical design and performance improvement", Proc. SPIE 9068, Eighth International Conference on Thin Film Physics and Applications, 90680G (16 December 2013); https://doi.org/10.1117/12.2054369
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Cited by 2 scholarly publications.
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KEYWORDS
Thin films

Vanadium

Transmittance

Refractive index

Optical design

Sputter deposition

Infrared radiation

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