Dynamic shape measurements of rough surface with a two wavelength method

N. Andrés; L. A. Arévalo-Díaz; J. A. Lorda; V. Palero; J. Lobera; M. P. Arroyo

doi:10.1117/12.2061889

18 August 2014 Dynamic shape measurements of rough surface with a two wavelength method

N. Andrés, L. A. Arévalo-Díaz, J. A. Lorda, V. Palero, J. Lobera, M. P. Arroyo

Proceedings Volume 9204, Interferometry XVII: Advanced Applications; 92040B (2014) https://doi.org/10.1117/12.2061889
Event: SPIE Optical Engineering + Applications, 2014, San Diego, California, United States

Abstract

Digital Speckle Pattern Interferometry (DSPI) has been applied to measure shape of solid rough objects. A two wavelength setup with one single recording has been applied. Spatial Phase Shifting techniques, with different carrier fringes for each wavelength, have been used in order to produce a spatial multiplex. Selecting each aperture image in the Fourier plane, the amplitude and the phase of the object beam is obtained for each wavelength. The subtraction of those waves produces a wrapped phase map that can be considered a contour line map for a synthetic wavelength. The technique has been applied in different material and the visibility of the fringes is observed. The possibilities and limits of the technique have been analyzed.

Citation Download Citation

N. Andrés, L. A. Arévalo-Díaz, J. A. Lorda, V. Palero, J. Lobera, and M. P. Arroyo "Dynamic shape measurements of rough surface with a two wavelength method", Proc. SPIE 9204, Interferometry XVII: Advanced Applications, 92040B (18 August 2014); https://doi.org/10.1117/12.2061889

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KEYWORDS

Visibility

Beam splitters

Holograms

Interferometry

Fourier transforms

Speckle pattern

Multiplexing

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