Paper
23 July 2014 Pocket pumped image analysis
Author Affiliations +
Abstract
The pocket pumping technique is used to detect small electron trap sites. These traps, if present, degrade CCD charge transfer efficiency. To reveal traps in the active area, a CCD is illuminated with a flat field and, before image is read out, accumulated charges are moved back and forth number of times in parallel direction. As charges are moved over a trap, an electron is removed from the original pocket and re-emitted in the following pocket. As process repeats one pocket gets depleted and the neighboring pocket gets excess of charges. As a result a dipole" signal appears on the otherwise at background level. The amplitude of the dipole signal depends on the trap pumping efficiency. This paper is focused on trap identification technique and particularly on new methods developed for this purpose. The sensor with bad segments was deliberately chosen for algorithms development and to demonstrate sensitivity and power of new methods in uncovering sensor defects.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ivan Kotov, Paul O'Connor, and Neil Murray "Pocket pumped image analysis", Proc. SPIE 9154, High Energy, Optical, and Infrared Detectors for Astronomy VI, 91541K (23 July 2014); https://doi.org/10.1117/12.2054125
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Optical correlators

Image segmentation

Amplifiers

Charge-coupled devices

Sensors

Image analysis

Algorithm development

RELATED CONTENT


Back to Top