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Proceedings Article

Gaia on-board metrology: basic angle and best focus

[+] Author Affiliations
A. Mora, R. Kohley, J. Sahlmann, I. Serraller, W. van Reeven

European Space Astronomy Ctr. (Spain)

M. Biermann, W. Loeffler

Astronomisches Rechen-Institut (Germany)

A. G. A. Brown

Leiden Observatory, Leiden Univ. (Netherlands)

D. Busonero

INAF - Osservatorio Astrofisico di Torino (Italy)

L. Carminati, F. Chassat

Airbus Defence and Space (France)

J. M. Carrasco, C. Jordi

Institut del Ciències del Cosmos, Univ. de Barcelona (Spain)

M. Erdmann

European Space Research and Technology Ctr. (Netherlands)

W. L. M. Gielesen, T. C. van den Dool, L. L. A. Vosteen

TNO Science and Industry (Netherlands)

D. Katz, P. Panuzzo

GEPI, Observatoire de Paris, CNRS, Univ. Paris Diderot (France)

L. Lindegren

Lund Observatory, Lund Univ. (Sweden)

O. Marchal

Observatoire de Paris, CNRS, Univ. Paris Diderot (France)

G. Seabroke

Univ. College London (United Kingdom)

E. Serpell

ESA-ESOC Gaia Operations (Germany)

F. van Leeuwen

Institute of Astronomy, Univ. of Cambridge (United Kingdom)

Proc. SPIE 9143, Space Telescopes and Instrumentation 2014: Optical, Infrared, and Millimeter Wave, 91430X (August 2, 2014); doi:10.1117/12.2054602
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From Conference Volume 9143

  • Space Telescopes and Instrumentation 2014: Optical, Infrared, and Millimeter Wave
  • Jacobus M. Oschmann; Mark Clampin; Giovanni G. Fazio; Howard A. MacEwen
  • Montréal, Quebec, Canada | June 22, 2014

abstract

The Gaia payload ensures maximum passive stability using a single material, SiC, for most of its elements. Dedicated metrology instruments are, however, required to carry out two functions: monitoring the basic angle and refocusing the telescope. Two interferometers fed by the same laser are used to measure the basic angle changes at the level of μas (prad, micropixel), which is the highest level ever achieved in space. Two Shack- Hartmann wavefront sensors, combined with an ad-hoc analysis of the scientific data are used to define and reach the overall best-focus. In this contribution, the systems, data analysis, procedures and performance achieved during commissioning are presented . © (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation

A. Mora ; M. Biermann ; A. G. A. Brown ; D. Busonero ; L. Carminati, et al.
" Gaia on-board metrology: basic angle and best focus ", Proc. SPIE 9143, Space Telescopes and Instrumentation 2014: Optical, Infrared, and Millimeter Wave, 91430X (August 2, 2014); doi:10.1117/12.2054602; http://dx.doi.org/10.1117/12.2054602


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