Paper
28 August 2014 Using optical lattice for STED parallelization
Bin Yang, Frédéric Przybilla, Michael Mestre, Jean-Baptiste Trebbia, Brahim Lounis
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Abstract
Being a scanning microscopy, Stimulated Emission Depletion (STED) needs to be parallelized for fast wide-field imaging. Here, we achieve large parallelization of STED microscopy using well-designed Optical Lattice (OL) for depletion, together with a fast camera for detection. Depletion optical lattices with 100 intensity “zeros” are generated by four-beam interference. Scanning only a unit cell, as small as 290 nm by 290 nm, of the depletion OL is sufficient for STED imaging. The OL-STED microscopy acquires super-resolution images with 70 nm resolution and at the speed of 80 ms per image.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bin Yang, Frédéric Przybilla, Michael Mestre, Jean-Baptiste Trebbia, and Brahim Lounis "Using optical lattice for STED parallelization", Proc. SPIE 9169, Nanoimaging and Nanospectroscopy II, 91690E (28 August 2014); https://doi.org/10.1117/12.2064820
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Cited by 1 scholarly publication.
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KEYWORDS
Stimulated emission depletion microscopy

Cameras

Polarization

Microscopy

Luminescence

Prisms

Image resolution

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