Paper
16 December 2014 Variability-based global sensitivity analysis of circuit response
Author Affiliations +
Proceedings Volume 9290, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2014; 929035 (2014) https://doi.org/10.1117/12.2075203
Event: Symposium on Photonics Applications in Astronomy, Communications, Industry and High-Energy Physics Experiments, 2014, Warsaw, Poland
Abstract
The research problem of interest to this paper is: how to determine efficiently and objectively the most and the least influential parameters of a multimodule electronic system - given the system model f and the module parameter variation ranges. The author investigates if existing generic global sensitivity methods are applicable for electronic circuit design, even if they were developed (and successfully applied) in quite distant engineering areas. A photodiode detector analog front-end system response time is used to reveal capability of the selected global sensitivity approaches under study.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Leszek J. Opalski "Variability-based global sensitivity analysis of circuit response", Proc. SPIE 9290, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2014, 929035 (16 December 2014); https://doi.org/10.1117/12.2075203
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Cited by 3 scholarly publications.
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KEYWORDS
Silicon

Monte Carlo methods

Amplifiers

Photodiodes

Systems modeling

Critical dimension metrology

Statistical analysis

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