Paper
20 February 2015 Radiation-enhanced thermal diffusion of transition metal and rare earth ions into II-VI semiconductors
Author Affiliations +
Abstract
We report on study of gamma radiation-enhanced thermal diffusion of Transition Metal and Rare Earth ions into IIVI semiconductor crystals. ZnSe and ZnS samples with of iron thin film deposited on one facet were sealed in evacuated quartz ampoules at 10-3 Torr. The crystals were annealed for 14 days at 950°C under γ-irradiation from 60Co source. The irradiation dose rates of 43.99 R/s, 1.81 R/s were varied by distance between 60Co source and furnaces. For comparison, the samples were also annealed without irradiation at the same temperature. The spatial distributions of transition metal were measured by absorption of focused laser radiation at 5T2-5E mid-IR transitions of iron ions. In addition, samples of ZnSe were similarly sealed in evacuated quartz ampoules in the presence of Praseodymium metal and annealed at 950°C under 43.99 R/s and 0 R/s and the diffusion lengths and Pr concentrations were compared. The γ-irradiation results in better intrusion of the iron ions from the metal film and increase of the diffusion length at ~25%, while Praseodymium diffusion is dramatically enhanced by γ-irradiation during the annealing process.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alán Martinez, Lamario Williams, Ozarfar Gafarov, Dmitry Martyshkin, Vladimir Fedorov, and Sergey Mirov "Radiation-enhanced thermal diffusion of transition metal and rare earth ions into II-VI semiconductors", Proc. SPIE 9342, Solid State Lasers XXIV: Technology and Devices, 93420G (20 February 2015); https://doi.org/10.1117/12.2080409
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Diffusion

Crystals

Iron

Ions

Metals

Transition metals

Annealing

Back to Top