Paper
27 February 2015 Total internal reflection mirrors with ultra-low losses in 3 µm thick SOI waveguides
Timo Aalto, Mikko Harjanne, Sami Ylinen, Markku Kapulainen, Tapani Vehmas, Matteo Cherchi
Author Affiliations +
Proceedings Volume 9367, Silicon Photonics X; 93670B (2015) https://doi.org/10.1117/12.2079748
Event: SPIE OPTO, 2015, San Francisco, California, United States
Abstract
Total internal reflection (TIR) mirrors represent an ultra-compact and flexible method to turn light in a photonic integrated circuit (PIC). These can also have very broadband and polarisation independent operation. This paper presents results from 90 degree strip waveguide turning mirrors with novel geometry on a 3 μm SOI waveguide platform. The new TIR mirrors have record-low insertion loss of 0.08 dB/mirror. They are compared with previous designs that have demonstrated insertion losses down to 0.15 dB/mirror. The test structures consisted of up to 96 consecutive mirrors and were fabricated in a multi-project wafer run. The multi-moded test devices only propagate light in the fundamental mode. The mirrors can be used in single-mode PICs that combine low losses, small polarisation dependency, wide bandwidth and small footprint.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Timo Aalto, Mikko Harjanne, Sami Ylinen, Markku Kapulainen, Tapani Vehmas, and Matteo Cherchi "Total internal reflection mirrors with ultra-low losses in 3 µm thick SOI waveguides", Proc. SPIE 9367, Silicon Photonics X, 93670B (27 February 2015); https://doi.org/10.1117/12.2079748
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Mirrors

Waveguides

Photonic integrated circuits

Polarization

Dielectric polarization

Silicon

Neodymium

RELATED CONTENT


Back to Top