Paper
4 March 2015 In-line print defect inspection system based on parallelized algorithms
Chao Lv, Hongjun Zhou
Author Affiliations +
Proceedings Volume 9521, Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part I; 952108 (2015) https://doi.org/10.1117/12.2087231
Event: Selected Proceedings of the Photoelectronic Technology Committee Conferences held August-October 2014, 2014, China, China
Abstract
The core algorithm of an on-line print defects detection system is template matching. In this paper, we introduce a kind of edge-based template matching based on Canny’s edge detection method to find the edge information and do the matching work. Of all the detection algorithms, the most difficult problem is execution time, in order to reduce the execution time and improve the efficiency of execution, we introduce four different ways to solve and compare. They are Pyramidal algorithm, Multicore and Multi-Threading algorithm based on OpenMP, a Parallel algorithm based on Intel AVX Instruction Set, GPU computing based on OpenCL model. Through the results, we can find different characters of different ways, and then choose the best for your own system.
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Chao Lv and Hongjun Zhou "In-line print defect inspection system based on parallelized algorithms", Proc. SPIE 9521, Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part I, 952108 (4 March 2015); https://doi.org/10.1117/12.2087231
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KEYWORDS
Image processing

Detection and tracking algorithms

Data modeling

Defect inspection

Edge detection

Data storage

Defect detection

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