Paper
4 March 2015 Single and double oxidations in a 980-nm VCSEL: impact on certain electrical and optical properties
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Abstract
In this paper we present the simulation results of an oxide-confined, InGaAs/GaAs based vertical-cavity surface-emitting laser with three different configurations of the oxide apertures. We analyze the impact of the number and position of oxide layers on the carrier distribution in the laser's active region, distribution of the optical modes, and modulation properties.
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Patrycja Śpiewak, Tomasz Czyszanowski, Jarosław Walczak, Robert Sarzała, Philip Moser, Dieter Bimberg, James A. Lott, and Michał Wasiak "Single and double oxidations in a 980-nm VCSEL: impact on certain electrical and optical properties", Proc. SPIE 9381, Vertical-Cavity Surface-Emitting Lasers XIX, 93810N (4 March 2015); https://doi.org/10.1117/12.2078184
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Cited by 1 scholarly publication.
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KEYWORDS
Oxides

Vertical cavity surface emitting lasers

Electroluminescent displays

Oxidation

Capacitance

3D modeling

Resistance

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