Recovering data from noisy fringe patterns from a portable digital speckle pattern interferometer for in-situ inspection of painting hanging on the wall

P. Memmolo; G. Arena; M. Paturzo; G. Fatigati; M. Grilli; L. Pezzati; Pietro Ferraro

doi:10.1117/12.2087163

10 March 2015 Recovering data from noisy fringe patterns from a portable digital speckle pattern interferometer for in-situ inspection of painting hanging on the wall

P. Memmolo, G. Arena, M. Paturzo, G. Fatigati, M. Grilli, L. Pezzati, Pietro Ferraro

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Proceedings Volume 9386, Practical Holography XXIX: Materials and Applications; 93860X (2015) https://doi.org/10.1117/12.2087163
Event: SPIE OPTO, 2015, San Francisco, California, United States

Abstract

We report on a method for recovering data from a simple portable Digital Speckle Pattern Interferometer intended for utilization outside of laboratory conditions, without anti-vibration devices. We used the system for monitoring the structural behavior of a painting on wood, hanging on a wall. In such a situation, fringes, produced by the object displacements, were affected by random distortions caused by environment noise. However a satisfactory number of undistorted, or barely distorted, fringe patterns were found and utilized for processing.

We performed fast continuous acquisitions of consecutive interferograms, picking usable fringe patterns out of a large amount of recorded frames. This is the crucial task in the measurement procedure. For this purpose we developed a software routine, based on jointly analysis of both spectral content and fringe image sharpne ss, as selection rule. From the selected frames, by using a simple approach based on Hilbert Transform and Phase Unwrapping, via MAx-ﬂow (PUMA) algorithm, we were able to evaluate the painting whole structure deformations, caused by environmental thermo-hygrometric fluctuations.

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P. Memmolo, G. Arena, M. Paturzo, G. Fatigati, M. Grilli, L. Pezzati, and Pietro Ferraro "Recovering data from noisy fringe patterns from a portable digital speckle pattern interferometer for in-situ inspection of painting hanging on the wall", Proc. SPIE 9386, Practical Holography XXIX: Materials and Applications, 93860X (10 March 2015); https://doi.org/10.1117/12.2087163

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KEYWORDS

Fringe analysis

Interferometers

Speckle pattern

Holograms

Inspection

Software development

Digital holography

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