Paper
11 March 2015 Systematic study and quantification of optical forces on porous silicon nanoparticles
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Abstract
In this work, we report using an optical tweezers system to study the light-matter interaction and gradient optical forces of porous silicon nanoparticles. The particles are fabricated by first electrochemically etching a multi-layer porous film into a silicon wafer and then breaking up the film through ultrasonic fracturing. The particles have average pore diameters ranging from 20-30 nm. The fabricated batches of particles have diameters between approximately 100- 600nm. After fabrication, the particles are size-sorted by centrifugation. A commercially available optical tweezers system is used to systematically study the optical interaction with these nanoparticles. This work opens new strategic approaches to enhance optical forces and optical sensitivity to mechanical motion that can be the basis for future biophotonics applications.
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Fook Chiong Cheong, Tobias Paprotta, Jeremy W. Mares, Sharon M. Weiss, Jens Schumacher, and Alex E. Cable "Systematic study and quantification of optical forces on porous silicon nanoparticles", Proc. SPIE 9337, Nanoscale Imaging, Sensing, and Actuation for Biomedical Applications XII, 93370O (11 March 2015); https://doi.org/10.1117/12.2085503
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KEYWORDS
Particles

Nanoparticles

Optical tweezers

Silicon

Beam splitters

Refractive index

Silicon films

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