Metrological characterization of a large aperture Fizeau for x-ray mirrors measurement

Maurizio Vannoni; Idoia Freijo Martín

doi:10.1117/12.2184748

21 June 2015 Metrological characterization of a large aperture Fizeau for x-ray mirrors measurement

Proceedings Volume 9526, Modeling Aspects in Optical Metrology V; 95260A (2015) https://doi.org/10.1117/12.2184748
Event: SPIE Optical Metrology, 2015, Munich, Germany

Abstract

The European XFEL is a large facility under construction in Hamburg, Germany. It will provide a transversally fully coherent x-ray radiation with outstanding characteristics: high repetition rate (up to 2700 pulses with a 0.6 milliseconds long pulse train at 10Hz), short wavelength (down to 0.05 nm), short pulse (in the femtoseconds scale) and high average brilliance (1.61025 photons / s / mm2 / mrad2/ 0.1% bandwidth). Due to the very short wavelength and very high pulse energy, all the mirrors need to have high quality surface, to be very long, and at the same time to implement an effective cooling system. Matching these tight specifications and assessing them with high precision optical measurements is very challenging. In order to measure the mirrors and to characterize their interaction with the mechanical mounts, we equipped a Metrology Laboratory with a Large Aperture Fizeau. The system is a classical 100 mm diameter commercial Fizeau, with an additional expander providing a 300 mm diameter. Despite the commercial nature of the system, special care has been done in the polishing of the reference flats and in the expander quality. In this report, we show the preparation of the instrument, the calibration and the performance characterization, together with some preliminary results. We also describe the approach that we want to follow for the x-rays mirrors measurements. The final goal will be to characterize very long mirrors, almost 1 meter long, with nanometer accuracy.

Citation Download Citation

Maurizio Vannoni and Idoia Freijo Martín "Metrological characterization of a large aperture Fizeau for x-ray mirrors measurement", Proc. SPIE 9526, Modeling Aspects in Optical Metrology V, 95260A (21 June 2015); https://doi.org/10.1117/12.2184748

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