Resolution enhancement in phase imaging by using modulated illumination

Peng Gao

doi:10.1117/12.2199414

22 June 2015 Resolution enhancement in phase imaging by using modulated illumination

Peng Gao

Proceedings Volume 9525, Optical Measurement Systems for Industrial Inspection IX; 95250I (2015) https://doi.org/10.1117/12.2199414
Event: SPIE Optical Metrology, 2015, Munich, Germany

Abstract

In this paper we show how resolution enhancement in digital holographic microscopy (DHM) and reference-less phase retrieval approach is obtained by using modulated illuminations. The modulated illuminations, including structured illumination and speckle illumination, are generated by a spatial light modulator and used to illuminate the sample. The holograms or diffraction patterns of the object wave under these illuminations are recorded, from which the phase is reconstructed accordingly. The resolution of the reconstructed image has been improved, when the spectrum of object waves along different illuminations are synthesized.

Citation Download Citation

Peng Gao "Resolution enhancement in phase imaging by using modulated illumination", Proc. SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, 95250I (22 June 2015); https://doi.org/10.1117/12.2199414

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