Influence of error sources in speckle interferometry using only two speckle patterns

Y. Arai; S. Yokozeki

doi:10.1117/12.2182643

22 June 2015 Influence of error sources in speckle interferometry using only two speckle patterns

Y. Arai, S. Yokozeki

Proceedings Volume 9525, Optical Measurement Systems for Industrial Inspection IX; 95250W (2015) https://doi.org/10.1117/12.2182643
Event: SPIE Optical Metrology, 2015, Munich, Germany

Abstract

Speckle interferometry is one of important deformation measurement methods for an object with rough surfaces. Some technologies have been proposed in speckle interferometry. Under these technologies, the fringe analysis based on the idea of "difference of phase method" has been proposed by processing the information of speckle patterns on each pixel of camera. However, because there are a lot of speckle noises in the speckle pattern, a high resolution analysis cannot be realized by this method. To solve this problem, the novel fringe analysis method using a new optical system was proposed. The phase map is calculated with "phase of difference method" in this method. The deformation signal is extracted by an enhanced filtering technology for realizing a high resolution fringe analysis. In this new fringe analysis method, it is known that the measuring accuracy depends on some experimental conditions. In this paper, the relationship between the measuring accuracy and the measurement conditions of the method is discussed by using experimental results. It is confirmed that the S/N ratio of the fringe signal in the analyzing process is the important factor concerning the accuracy.

Citation Download Citation

Y. Arai and S. Yokozeki "Influence of error sources in speckle interferometry using only two speckle patterns", Proc. SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, 95250W (22 June 2015); https://doi.org/10.1117/12.2182643

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KEYWORDS

Speckle

Speckle pattern

Speckle interferometry

Digital holography

Fringe analysis

Interference (communication)

Interferometry

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