Paper
22 June 2015 Realistic simulation of camera images of local surface defects in the context of multi-sensor inspection systems
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Abstract
Industrial automation has developed rapidly in the past decades. Customized fabrications and short production time require flexible and high speed inspection systems. Based on these requirements, optical surface inspection systems (OSIS) as efficient and cheap systems for detecting surface defects and none-defects becomes more and more important. To achieve a high recognition rate, huge amounts of image data of defects need to be stored. We introduce a virtual surface defect rendering method to obtain large amount of defect images. In this paper, the ray tracing methods are applied to realistically simulate camera images in OSIS. We used three different bidirectional reflectance distribution function (BRDF) rendering models to describe the scattering between collimated white light and aluminum materials.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Haiyue Yang, Tobias Haist, Marc Gronle, and Wolfgang Osten "Realistic simulation of camera images of local surface defects in the context of multi-sensor inspection systems", Proc. SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, 952522 (22 June 2015); https://doi.org/10.1117/12.2184612
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Cited by 1 scholarly publication.
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KEYWORDS
Bidirectional reflectance transmission function

Inspection

Ray tracing

Light scattering

Cameras

Imaging systems

Scattering

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