Application of a reflectance model to the sensor planning system

Tomáš Koutecký; David Paloušek; Jan Brandejs

doi:10.1117/12.2184890

22 June 2015 Application of a reflectance model to the sensor planning system

Tomáš Koutecký, David Paloušek, Jan Brandejs

Proceedings Volume 9530, Automated Visual Inspection and Machine Vision; 953005 (2015) https://doi.org/10.1117/12.2184890
Event: SPIE Optical Metrology, 2015, Munich, Germany

Abstract

This study describes a new sensor planning system for the automatic generation of scanning positions based on a computer model of the part for digitization of sheet metal parts. The focus of this paper is in the application of a reflectance model into this sensor planning system. The goal of this sensor planning system and application of this model is to ensure fast, complete and accurate digitization of the parts for their inspection during serial-line production, especially in the automotive industry. A methodology of the sensor planning system consists of positions planning, their simulation for true visibility of the part elements using a reflectance model, and a simulation of the positions for robot reachability. Compared to previous studies, visual properties of the scanned parts’ surface can be simulated precisely. The Nayar model is used as a reflectance model. This model is suitable for materials that are characterized by the combination of diffuse and specular reflections and uses three components of reflection: diffuse, specular lobe and specular spike. Results of the scanning that were obtained using an ATOS III Triple Scan fringe projection 3D scanner and a KUKA KR 60 HA industrial robot were compared to the simulation. The comparison based on the correspondence of the polygons area acquired in each sensor position (in simulation and in scanning) shows that in the performed measurements the median of differences between simulation and scanning is around 16%.

Citation Download Citation

Tomáš Koutecký, David Paloušek, and Jan Brandejs "Application of a reflectance model to the sensor planning system", Proc. SPIE 9530, Automated Visual Inspection and Machine Vision, 953005 (22 June 2015); https://doi.org/10.1117/12.2184890

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