Paper
17 July 2015 Deformation measurement of carbon fiber reinforced plastics using phase-shifting scanning electron microscope Moiré method after Fourier transform
Qinghua Wang, Shien Ri, Hiroshi Tsuda, Satoshi Kishimoto, Yoshihisa Tanaka, Yutaka Kagawa
Author Affiliations +
Proceedings Volume 9524, International Conference on Optical and Photonic Engineering (icOPEN 2015); 95240I (2015) https://doi.org/10.1117/12.2186145
Event: International Conference on Optical and Photonic Engineering (icOPEN2015), 2015, Singapore, Singapore
Abstract
The deformation distributions of carbon fiber reinforced plastics (CFRP) under a three-point bending load were nondestructively investigated using the phase shifting scanning electron microscope (SEM) moiré method. The complex fast Fourier transform (FFT) and the discrete Fourier transform (DFT) were used to filter the useless moiré fringes in the case of bidirectional moiré fringes. The SEM moiré fringes under different magnifications and the deformation results measured by the direct, complex FFT- and the DFT- phase shifting moiré methods as well as the moiré fringe centering method were compared and analyzed. Experiments demonstrate that the deformation measurement is a bit influenced by the useless moiré fringes in the phase shifting moiré methods and complex FFT processing works better for nondense moiré fringes. The relative strain changes gradually and the specimen grating pitch increases gradually from top to bottom along the loading direction, suggesting that the real compressive strain is greater in the upper side. The micro/nano-scale deformation distribution characteristic is helpful for better understanding of the mechanical properties of the CFRP specimen.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Qinghua Wang, Shien Ri, Hiroshi Tsuda, Satoshi Kishimoto, Yoshihisa Tanaka, and Yutaka Kagawa "Deformation measurement of carbon fiber reinforced plastics using phase-shifting scanning electron microscope Moiré method after Fourier transform", Proc. SPIE 9524, International Conference on Optical and Photonic Engineering (icOPEN 2015), 95240I (17 July 2015); https://doi.org/10.1117/12.2186145
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Cited by 3 scholarly publications.
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KEYWORDS
Scanning electron microscopy

Phase shifting

Phase shifts

Fourier transforms

Moire patterns

Image filtering

Carbon

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