Paper
1 September 2015 Polarization-based complex index of refraction estimation with diffuse scattering consideration
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Abstract
Optical polarimetry is an approach that shows promise for refractive index estimation from scattering off a target’s surface, which is task of pivotal importance for remote sensing and computer graphics applications. However, the estimation often relies on a microfacet polarimetric bidirectional reflectance distribution function (pBRDF) that is limited to specular targets involving single surface scattering. In this paper, we develop an analytic model for the degree of polarization (DOP) reflected from a rough surface that includes a multiplicative factor for the effect of diffuse scattering. Evaluation of the model indicates that diffuse scattering can significantly affect the DOP values, and the biased DOP values can further lead to inaccurate estimation of the surface refractive index.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hanyu Zhan, David G. Voelz, Xifeng Xiao, and Sang-Yeon Cho "Polarization-based complex index of refraction estimation with diffuse scattering consideration", Proc. SPIE 9613, Polarization Science and Remote Sensing VII, 96130Y (1 September 2015); https://doi.org/10.1117/12.2188281
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Scattering

Refractive index

Copper

Polarization

Light scattering

Platinum

Dielectrics

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