Large format focal plane array integration with precision alignment, metrology and accuracy capabilities

Jay Neumann; Russell Parlato; Gregory Tracy; Max Randolph

doi:10.1117/12.2189690

1 September 2015 Large format focal plane array integration with precision alignment, metrology and accuracy capabilities

Jay Neumann, Russell Parlato, Gregory Tracy, Max Randolph

Author Affiliations +

Proceedings Volume 9608, Infrared Remote Sensing and Instrumentation XXIII; 96080Z (2015) https://doi.org/10.1117/12.2189690
Event: SPIE Optical Engineering + Applications, 2015, San Diego, California, United States

Abstract

Focal plane alignment for large format arrays and faster optical systems require enhanced precision methodology and stability over temperature. The increase in focal plane array size continues to drive the alignment capability. Depending on the optical system, the focal plane flatness of less than 25μm (.001”) is required over transition temperatures from ambient to cooled operating temperatures. The focal plane flatness requirement must also be maintained in airborne or launch vibration environments. This paper addresses the challenge of the detector integration into the focal plane module and housing assemblies, the methodology to reduce error terms during integration and the evaluation of thermal effects. The driving factors influencing the alignment accuracy include: datum transfers, material effects over temperature, alignment stability over test, adjustment precision and traceability to NIST standard. The FPA module design and alignment methodology reduces the error terms by minimizing the measurement transfers to the housing. In the design, the proper material selection requires matched coefficient of expansion materials minimizes both the physical shift over temperature as well as lowering the stress induced into the detector. When required, the co-registration of focal planes and filters can achieve submicron relative positioning by applying precision equipment, interferometry and piezoelectric positioning stages. All measurements and characterizations maintain traceability to NIST standards. The metrology characterizes the equipment’s accuracy, repeatability and precision of the measurements.

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Jay Neumann, Russell Parlato, Gregory Tracy, and Max Randolph "Large format focal plane array integration with precision alignment, metrology and accuracy capabilities", Proc. SPIE 9608, Infrared Remote Sensing and Instrumentation XXIII, 96080Z (1 September 2015); https://doi.org/10.1117/12.2189690

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KEYWORDS

Staring arrays

Optical alignment

Interfaces

Image processing

Sensors

Beryllium

Assembly tolerances

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