Paper
11 September 2015 On some limitations of adaptive feedback measurement algorithm
Author Affiliations +
Proceedings Volume 9662, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2015; 96621W (2015) https://doi.org/10.1117/12.2205347
Event: XXXVI Symposium on Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments (Wilga 2015), 2015, Wilga, Poland
Abstract
The brilliant idea of Adaptive Feedback Control Systems (AFCS) makes possible creation of highly efficient adaptive systems for estimation, identification and filtering of signals and physical processes. The research problem considered in this paper is: how performance of AFCS changes if some of the assumptions used to formulate iterative estimation algorithm are not fulfilled exactly. To limit the scope of research a particular implementation of the AFCS concept was considered, i.e. an adaptive feedback measurement system (AFMS). The iterative measurement algorithm used was derived under some idealized conditions, notably with perfect knowledge of the system model and Gaussian communication channels. The selected non-idealities of interest are non-zero mean value of noise processes and non-ideal calibration of transmission gain in the forward channel - because they are related to intrinsic non-idealities of analog building blocks, used for the AFMS implementation. The presented original analysis of the iterative measurement algorithm provides quantitative information on speed of convergence and limit behavior. The analysis should be useful for AFCS implementors in the measurement area - since the results are presented in terms of accuracy and precision of iterative measurement process.
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Leszek J. Opalski "On some limitations of adaptive feedback measurement algorithm", Proc. SPIE 9662, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2015, 96621W (11 September 2015); https://doi.org/10.1117/12.2205347
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KEYWORDS
Berkelium

Signal processing

Calibration

Transmitters

Atomic force microscopy

Analog electronics

Interference (communication)

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