Raman studies of C-Ni/Ti films deposited on Si (100)

R. Belka; J. Keczkowska; M. Suchańska; P. Firek; H. Wronka; J. Radomska; E. Czerwosz

doi:10.1117/12.2205546

11 September 2015 Raman studies of C-Ni/Ti films deposited on Si (100)

R. Belka, J. Keczkowska, M. Suchańska, P. Firek, H. Wronka, J. Radomska, E. Czerwosz

Proceedings Volume 9662, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2015; 966249 (2015) https://doi.org/10.1117/12.2205546
Event: XXXVI Symposium on Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments (Wilga 2015), 2015, Wilga, Poland

Abstract

The thin films of carbon-nickel (C-Ni) nanocoposites were deposited on Ti-evaporated Si (100) substrate using Physical Vapour Deposition (PVD) method. Influence of evaporated titanium on carbonaceous structure of C-Ni films were investigated by Raman spectroscopy method. The fullerite-graphite structure was recognize using principal component analysis (PCA) of obtained Raman spectra.

Citation Download Citation

R. Belka, J. Keczkowska, M. Suchańska, P. Firek, H. Wronka, J. Radomska, and E. Czerwosz "Raman studies of C-Ni/Ti films deposited on Si (100)", Proc. SPIE 9662, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2015, 966249 (11 September 2015); https://doi.org/10.1117/12.2205546

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