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Proceedings Article

Opportunities and limitations for combined fly-scan ptychography and fluorescence microscopy

[+] Author Affiliations
Junjing Deng

Northwestern Univ. (United States)

David J. Vine, Si Chen, Youssef S. G. Nashed, Tom Peterka, Rob Ross, Stefan Vogt, Chris J. Jacobsen

Argonne National Lab. (United States)

Proc. SPIE 9592, X-Ray Nanoimaging: Instruments and Methods II, 95920U (September 18, 2015); doi:10.1117/12.2190749
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From Conference Volume 9592

  • X-Ray Nanoimaging: Instruments and Methods II
  • Barry Lai
  • San Diego, California, United States | August 09, 2015

abstract

X-ray fluorescence offers unparalleled sensitivity for imaging the nanoscale distribution of trace elements in micrometer thick samples, while x-ray ptychography offers an approach to image weakly fluorescing lighter elements at a resolution beyond that of the x-ray lens used. These methods can be used in combination, and in continuous scan mode for rapid data acquisition when using multiple probe mode reconstruction methods. We discuss here the opportunities and limitations of making use of additional information provided by ptychography to improve x-ray fluorescence images in two ways: by using position-error-correction algorithms to correct for scan distortions in fluorescence scans, and by considering the signal-to-noise limits on previously-demonstrated ptychographic probe deconvolution methods. This highlights the advantages of using a combined approach. © (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation

Junjing Deng ; David J. Vine ; Si Chen ; Youssef S. G. Nashed ; Tom Peterka, et al.
" Opportunities and limitations for combined fly-scan ptychography and fluorescence microscopy ", Proc. SPIE 9592, X-Ray Nanoimaging: Instruments and Methods II, 95920U (September 18, 2015); doi:10.1117/12.2190749; http://dx.doi.org/10.1117/12.2190749


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