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Space Objects Identification(SOI) and related technology have aroused wide attention from spacefaring nations due to the increasingly severe space environment. Multiple ground-based assets have been employed to acquire statistical survey data, detect faint debris, acquire photometric and spectroscopic data. Great efforts have been made to characterize different space objects using the statistical data acquired by telescopes. Furthermore, detailed laboratory data are needed to optimize the characterization of orbital debris and satellites via material composition and potential rotation axes, which calls for a high-precision and flexible optical measurement system. A typical method of taking optical measurements of a space object(or model) is to move light source and sensors through every possible orientation around it and keep the target still. However, moving equipments to accurate orientations in the air is difficult, especially for those large precise instruments sensitive to vibrations. Here, a rotation structure of "3+1" axes, with a three-axis turntable manipulating attitudes of the target and the sensor revolving around a single axis, is utilized to emulate every possible illumination condition in space, which can also avoid the inconvenience of moving large aparatus. Firstly, the source-target-sensor orientation of a real satellite was analyzed with vectors and coordinate systems built to illustrate their spatial relationship. By bending the Reference Coordinate Frame to the Phase Angle plane, the sensor only need to revolve around a single axis while the other three degrees of freedom(DOF) are associated with the Euler’s angles of the satellite. Then according to practical engineering requirements, an integrated rotation system of four-axis structure is brought forward. Schemetic diagrams of the three-axis turntable and other equipments show an overview of the future laboratory layout. Finally, proposals on evironment arrangements, light source precautions and sensor selections are provided. Comparing to current methods, this design shows better effects on device simplication, automatic control and high-precision measurement.
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