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Proceedings Article

Gabor-domain optical coherence microscopy with integrated dual-axis MEMS scanner for fast 3D imaging and metrology

[+] Author Affiliations
Cristina Canavesi, Jannick P. Rolland

LighTopTech Corp. (United States)

Andrea Cogliati

Univ. of Rochester (United States)

Adam Hayes, Patrice Tankam

The Institute of Optics, Univ. of Rochester (United States)

Anand P. Santhanam

Univ. of California, Los Angeles (United States)

Proc. SPIE 9633, Optifab 2015, 96330O (October 11, 2015); doi:10.1117/12.2195828
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From Conference Volume 9633

  • Optifab 2015
  • Julie L. Bentley; Sebastian Stoebenau
  • Rochester, New York, United States | October 12, 2015

abstract

Fast, robust, nondestructive 3D imaging is needed for characterization of microscopic structures in industrial and clinical applications. A custom micro-electromechanical system (MEMS)-based 2D scanner system was developed to achieve 55 kHz A-scan acquisition in a Gabor-domain optical coherence microscopy (GD-OCM) instrument with a novel multilevel GPU architecture for high-speed imaging. GD-OCM yields high-definition volumetric imaging with dynamic depth of focusing through a bio-inspired liquid lens-based microscope design, which has no moving parts and is suitable for use in a manufacturing setting or in a medical environment. A dual-axis MEMS mirror was chosen to replace two single-axis galvanometer mirrors; as a result, the astigmatism caused by the mismatch between the optical pupil and the scanning location was eliminated and a 12x reduction in volume of the scanning system was achieved. Imaging at an invariant resolution of 2 μm was demonstrated throughout a volume of 1 × 1 × 0.6 mm3, acquired in less than 2 minutes. The MEMS-based scanner resulted in improved image quality, increased robustness and lighter weight of the system – all factors that are critical for on-field deployment. A custom integrated feedback system consisting of a laser diode and a position-sensing detector was developed to investigate the impact of the resonant frequency of the MEMS and the driving signal of the scanner on the movement of the mirror. Results on the metrology of manufactured materials and characterization of tissue samples with GD-OCM are presented. © (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation

Cristina Canavesi ; Andrea Cogliati ; Adam Hayes ; Anand P. Santhanam ; Patrice Tankam, et al.
" Gabor-domain optical coherence microscopy with integrated dual-axis MEMS scanner for fast 3D imaging and metrology ", Proc. SPIE 9633, Optifab 2015, 96330O (October 11, 2015); doi:10.1117/12.2195828; http://dx.doi.org/10.1117/12.2195828


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