Laser damage resistance of optical components in sub-picosecond regime in the infrared

Martin Sozet; Jérôme Néauport; Eric Lavastre; Nadja Roquin; Laurent Gallais; Laurent Lamaignère

doi:10.1117/12.2194286

23 November 2015 Laser damage resistance of optical components in sub-picosecond regime in the infrared

Martin Sozet, Jérôme Néauport, Eric Lavastre, Nadja Roquin, Laurent Gallais, Laurent Lamaignère

Proceedings Volume 9632, Laser-Induced Damage in Optical Materials: 2015; 96320N (2015) https://doi.org/10.1117/12.2194286
Event: SPIE Laser Damage, 2015, Boulder, Colorado, United States

Abstract

A rasterscan procedure is set to determine laser-induced damage densities in sub-picosecond regime at 1053nm on high-reflective coatings. Whereas laser-induced damage is usually considered deterministic in this regime, damage events occur on these structures for fluences lower than their intrinsic Laser-Induced Damage Threshold (LIDT). Damage densities are found to be high even for fluences as low as 20% of the LIDT. Scanning Electron Microscope observations of these “under threshold” damage sites evidence ejections of defects, embedded in the dielectric stack. It brings a new viewpoint for the qualification of optical components and for the optimization of manufacturing processes of coatings.

Citation Download Citation

Martin Sozet, Jérôme Néauport, Eric Lavastre, Nadja Roquin, Laurent Gallais, and Laurent Lamaignère "Laser damage resistance of optical components in sub-picosecond regime in the infrared", Proc. SPIE 9632, Laser-Induced Damage in Optical Materials: 2015, 96320N (23 November 2015); https://doi.org/10.1117/12.2194286

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