Paper
7 March 2016 Extraction of optical properties in the sub-diffuse regime by spatially resolved reflectance spectroscopy
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Abstract
In this paper, the commonly used inverse Monte Carlo model based on absorption and reduced scattering coefficients is extended by a well-known similarity parameter γ (gamma), which carries additional information on the phase function. Sub-diffuse reflectance measurements at five source-detector separations were used to extract the absorption and reduced scattering coefficients and phase function information encapsulated in γ. The performance of the extended inverse Monte Carlo model was evaluated by simulated and experimental reflectance spectra of turbid phantoms. A three-fold increase in the accuracy of the extended inverse Monte Carlo model that incorporates γ was observed.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peter Naglič, Blaž Cugmas, Franjo Pernuš, Boštjan Likar, and Miran Bürmen "Extraction of optical properties in the sub-diffuse regime by spatially resolved reflectance spectroscopy", Proc. SPIE 9706, Optical Interactions with Tissue and Cells XXVII, 97061C (7 March 2016); https://doi.org/10.1117/12.2212947
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Cited by 1 scholarly publication.
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KEYWORDS
Reflectivity

Monte Carlo methods

Scattering

Data modeling

Optical fibers

Optical properties

Performance modeling

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