Paper
21 April 2016 Study on structural and optical properties of TiO2 ALD coated silicon nanostructures
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Abstract
Structural and optical properties of TiO2 ALD coated silicon nanostructures were investigated. The morphology and chemical composition of TiO2 coated silicon nanopillars and porous silicon were studied by using methods of scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDX). Optical characteristics were studied using measurements of reflectance and luminescence spectra. Detailed analysis of morphological features and photoluminescence mechanisms were provided. Peculiarities of reflectance spectra were discussed. It was shown the possible application of these structures as antireflectance coatings.
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Mykola Pavlenko, Valerii Myndrul, Igor Iatsunskyi, Stefan Jurga, and Valentyn Smyntyna "Study on structural and optical properties of TiO2 ALD coated silicon nanostructures", Proc. SPIE 9884, Nanophotonics VI, 98842H (21 April 2016); https://doi.org/10.1117/12.2227122
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Cited by 1 scholarly publication.
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KEYWORDS
Silicon

Titanium dioxide

Atomic layer deposition

Reflectivity

Etching

Nanostructures

Nanostructures

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