Sensing roughness and polish direction

M. L. Jakobsen; A. S. Olesen; H. E. Larsen; J. Stubager; S. G. Hanson; T. F. Pedersen; H. C. Pedersen

doi:10.1117/12.2229440

26 April 2016 Sensing roughness and polish direction

M. L. Jakobsen, A. S. Olesen, H. E. Larsen, J. Stubager, S. G. Hanson, T. F. Pedersen, H. C. Pedersen

Proceedings Volume 9890, Optical Micro- and Nanometrology VI; 98900S (2016) https://doi.org/10.1117/12.2229440
Event: SPIE Photonics Europe, 2016, Brussels, Belgium

Abstract

As a part of the work carried out on a project supported by the Danish council for technology and innovation, we have investigated the option of smoothing standard CNC machined surfaces. In the process of constructing optical prototypes, involving custom-designed optics, the development cost and time consumption can become relatively large numbers in a research budget. Machining the optical surfaces directly is expensive and time consuming. Alternatively, a more standardized and cheaper machining method can be used, but then the object needs to be manually polished. During the polishing process the operator needs information about the RMS-value of the surface roughness and the current direction of the scratches introduces by the polishing process. The RMS-value indicates to the operator how far he is from the final finish, and the scratch orientation is often specified by the customer in order to avoid complications during the casting process.

In this work we present a method for measuring the RMS-values of the surface roughness while simultaneously determining the polishing direction. We are mainly interested in the RMS-values in the range from 0 – 100 nm, which corresponds to the finish categories of A1, A2 and A3. Based on simple intensity measurements we estimates the RMS-value of the surface roughness, and by using a sectioned annual photo-detector to collect the scattered light we can determine the direction of polishing and distinguish light scattered from random structures and light scattered from scratches.

Citation Download Citation

M. L. Jakobsen, A. S. Olesen, H. E. Larsen, J. Stubager, S. G. Hanson, T. F. Pedersen, and H. C. Pedersen "Sensing roughness and polish direction", Proc. SPIE 9890, Optical Micro- and Nanometrology VI, 98900S (26 April 2016); https://doi.org/10.1117/12.2229440

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
8 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Sensors

Surface finishing

Polishing

Light scattering

Photodetectors

Surface roughness

Optical sensors

Show All Keywords

Keywords/Phrases

Search In:

Publication Years