Evaluation of single-shot and two-shot fringe pattern phase demodulation algorithms aided by the Hilbert-Huang transform

Maciej Trusiak; Krzysztof Patorski; Lukasz Sluzewski; Zofia Sunderland

doi:10.1117/12.2228350

26 April 2016 Evaluation of single-shot and two-shot fringe pattern phase demodulation algorithms aided by the Hilbert-Huang transform

Maciej Trusiak, Krzysztof Patorski, Lukasz Sluzewski, Zofia Sunderland

Author Affiliations +

Proceedings Volume 9890, Optical Micro- and Nanometrology VI; 98900V (2016) https://doi.org/10.1117/12.2228350
Event: SPIE Photonics Europe, 2016, Brussels, Belgium

Abstract

In this contribution we evaluate single and two-shot techniques, namely the Hilbert spiral transform (HST) and the Gram-Schmidt orthonormalization (GSO) in terms of phase demodulation accuracy in the complex fringe patterns analysis (i.e., with strong background/contrast variations, severe noise, considerable local gradients of fringe shape/orientation). Both methods are aided by the novel Hilbert-Huang transform (HHT) processing to adaptively reduce demodulation errors. The HST utilizes a spiral phase function and a spatial fringe orientation map to demodulate phase of complex fringes. It is especially susceptible to uneven bias term and noise. The HHT method realizes bias/noise suppression adaptively with outstanding accuracy. The GSO is a fast two-shot fringe-shape-robust phase demodulation scheme. It treats two arbitrarily phase shifted interferograms as vectors and conducts orthogonal projection of one vector onto another. The GSO is susceptible to background, contrast and noise fluctuations, however. The HHT method is perfectly suitable to perform efficient pre-filtering. Both methods (HHT-HST and HHT-GSO) are proven versatile and robust to fringe pattern defects using simulation and experiment.

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Maciej Trusiak, Krzysztof Patorski, Lukasz Sluzewski, and Zofia Sunderland "Evaluation of single-shot and two-shot fringe pattern phase demodulation algorithms aided by the Hilbert-Huang transform", Proc. SPIE 9890, Optical Micro- and Nanometrology VI, 98900V (26 April 2016); https://doi.org/10.1117/12.2228350

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KEYWORDS

Fringe analysis

Demodulation

Principal component analysis

Phase shifts

Computer simulations

Digital filtering

Phase shift keying

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