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Proceedings Article

Study of the P3HT/PCBM interface using photoemission yield spectroscopy

[+] Author Affiliations
Raitis Grzibovskis, Aivars Vembris

Univ. of Latvia (Latvia)

Proc. SPIE 9895, Organic Photonics VII, 98950Q (April 27, 2016); doi:10.1117/12.2227823
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From Conference Volume 9895

  • Organic Photonics VII
  • David Cheyns; Pierre M. Beaujuge; Volker van Elsbergen; Jean-Charles Ribierre
  • Brussels, Belgium | April 03, 2016

abstract

Photogeneration efficiency and charge carrier extraction from active layer are the parameters that determine the efficiency of organic photovoltaics (OPVs). Devices made of organic materials often consist of thin (up to 100nm) layers. At this thickness different interface effects become more pronounced. The electron affinity and ionization energy shift can affect the charge carrier transport across metal-organic interface which can affect the performance of the entire device. In the case of multilayer OPVs, energy level compatibility at the organic-organic interface is as important. Photoemission yield spectroscopy was used for organic-organic interface study by ionization energy measurements. In this work we studied “sandwich” type samples of two well-known organic photovoltaic materials- poly(3- hexylthiophene-2,5-diyl) (P3HT) and [6,6]-phenyl C61 butyric acid methyl ester (PCBM). Ionization energy changes at the P3HT/PCBM interface depending on PCBM layer thickness were studied. P3HT layer was obtained by spin-coating while PCBM was deposited on the P3HT by thermal evaporation in vacuum. No ionization energy shift of P3HT was observed. On the contrary, PCBM at the interface with P3HT created additional 0.40eV barrier for hole transport from PCBM to P3HT. © (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation

Raitis Grzibovskis and Aivars Vembris
" Study of the P3HT/PCBM interface using photoemission yield spectroscopy ", Proc. SPIE 9895, Organic Photonics VII, 98950Q (April 27, 2016); doi:10.1117/12.2227823; http://dx.doi.org/10.1117/12.2227823


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