Paper
12 May 2016 Tackling the x-ray cargo inspection challenge using machine learning
Nicolas Jaccard, Thomas W. Rogers, Edward J. Morton, Lewis D. Griffin
Author Affiliations +
Abstract
The current infrastructure for non-intrusive inspection of cargo containers cannot accommodate exploding com-merce volumes and increasingly stringent regulations. There is a pressing need to develop methods to automate parts of the inspection workflow, enabling expert operators to focus on a manageable number of high-risk images. To tackle this challenge, we developed a modular framework for automated X-ray cargo image inspection. Employing state-of-the-art machine learning approaches, including deep learning, we demonstrate high performance for empty container verification and specific threat detection. This work constitutes a significant step towards the partial automation of X-ray cargo image inspection.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nicolas Jaccard, Thomas W. Rogers, Edward J. Morton, and Lewis D. Griffin "Tackling the x-ray cargo inspection challenge using machine learning", Proc. SPIE 9847, Anomaly Detection and Imaging with X-Rays (ADIX), 98470N (12 May 2016); https://doi.org/10.1117/12.2222765
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CITATIONS
Cited by 13 scholarly publications and 5 patents.
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KEYWORDS
X-rays

X-ray imaging

Inspection

System on a chip

Machine learning

Image segmentation

Visualization

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